overview

flying probe in-circuit tester

description

hioki pcb and substrate inspection equipment leverages our core competency in high precision component testing. the fa1240 series is a 4-arm populated board inspection tool that delivers multi-functional testing in as fast as 0.025 sec./step.
 

key features

• quickly complete programs that take into account component height
• automatically calculate arm interference (when used with the ua1780)
• designed to improve probe replaceability, dramatically reducing system downtime caused by probe replacement
• high-speed testing at up to 0.025 sec./step
• detect ic lead float and pseudo-contact states
• support for active testing (optional feature)
• high-precision probing
• large testing area of 510 × 460 mm (fa1240-61)
• standard transport capability
• automatic alignment function and simple visual test function