keysight nx5402a silicon photonics wafer test system


category: application-specific test systems and components

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nx5402a silicon photonics wafer test system is a solution of keysight nx5400 silicon photonics test solution series. it provides all required features for volume production testing such as wafer acceptance testing (wat) or process control monitoring (pcm) with a fully automated wafer prober for volume production.

  • one-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
  • automated one pass testing for complex and massive optical and electrical measurements
  • volume production-ready with secs/gem factory automation, safety interlock, and clean room-ready features
  • high throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
  • guaranteed system performance by keysight's advanced wafer-level photonic calibration
  • dedicated support model enabling high system availability for production
  • keysight-developed fiber alignment and positioning system
  • leading-edge pathwave semiconductor test software integrating keysight specs
  • reliable performance monitoring by build-in automatic system diagnostics
  • automated multi-recipe execution software enabling multiple recipes to run in batch mode

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keysight nx5402a silicon photonics wafer test system


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